Flexible embedded test solution for high-speed analogue front-end architectures
نویسندگان
چکیده
منابع مشابه
Flexible embedded test solution for high-speed analogue front-end architectures - Circuits, Devices and Systems, IEE Proceedings [see also IEE Proceedings G- Circuits, Devices and
A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip...
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ژورنال
عنوان ژورنال: IEE Proceedings - Circuits, Devices and Systems
سال: 2004
ISSN: 1350-2409
DOI: 10.1049/ip-cds:20040557